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Production & Characterization Test Solutions

Instruments | Software | Consulting
Our Story

Merlin Test Technologies was founded in May of 2017. Its headquarters resides in Bastrop, TX and offices out of Shanghai, China. Our expertise is in semiconductor IC test.

Specializing In

  • Complete Production & Characterization Test Solutions

  • Stand-alone testing instruments

  • Data analysis software

  • Characterization & Production Consulting

Technology

ATE Systems

Port Modules

Amp Modules

Cellular Signal Software Analysis

WLAN Signal Analysis Software

Who are we

Products

ATE Systems

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Merlin’s ATE System is a significant reduction to the cost of test and enables fast time to implementation.  APS100 is based on production-proven, high-speed PXI modular instrumentation that provides industry-leading test time.  This ATE system is a turn-key solution that covers RF, digital, and power needs for the rapid deployment of products into production.  The APS100 DUT interface is a Merlin Test custom design that allows for easy implementation of soft dock configurations.  The system is also expandable to add additional digital or power channels as the application requires.  Finally, the APS100 software provided allows for a full factory implementation for production needs including GUI, handler control, data collection, and STDF outputs.

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Features

  • Complete ATE System including system software

  • High accuracy source and measure with 1GHz modulation bandwidth

  • High speed, reliable solid-state design

  • 6 GHz+ frequency range, extendable with built-in doubler and optional downconverter

  • High Source output power

  • Support for 16 bidirectional ports (8 with VNA features) and 30 RF measure ports and 4 simultaneous source selectable ports

  • Digital 32 channels with MIPI and pattern

  • Full modulation support

  • DPS Power supply

 

Applications

  • RF switch devices, antenna tuners

  • PA/FEM for 2G thru 5G and WLAN/AX

 

Software

  • GUI with full features for factory integration

  • STDF output format

  • Visual Studio programming

  • Handler Support

Instruments

RF110 - Source Port Module

  • 1U form factor

  • 16 Bi-directional ports

  • RF frequency response of 50MHz to 12GHz

  • Vector S-parameters, IP3, Noise figure capability

  • High Output Power >22dBm

  • Port to Port Isolation > 90 dB

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RF210 - Measure Port Module

  • 1U form factor

  • 30 high isolation ports

  • RF frequency response of 50MHz to 22GHz

  • 31dB dynamic range with 0.25dB increments

  • Port to Port Isolation > 90 dB

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HPA100 – High Power Amp Module

  • 3U form factor

  • 300MHz to 2.7GHz

  • 4 Channels, 35W each

  • Coupled monitoring port

  • Ethernet interface

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Analysis Software

5G NR

The Merlin Test NR analysis library provides a fast and flexible way to perform modulation accuracy and spectral measurements of 5G waveforms. The library supports analysis of uplink waveforms in the FR1
frequency range according to 3GPP TS 38.521.

 

Results include:

  • Overall RMS EVM

  • EVM per symbol, slot, and subcarrier

  • Adjacent channel power (UTRA / NR) 

  • Carrier frequency offset

  • Equalized symbols constellation

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WLAN

The Merlin Test WLAN analysis libraries provide a fast and flexible way to perform modulation accuracy and spectral measurements of WLAN waveforms. The libraries support analysis of most IEEE 802.11 Wi-Fi standards including 802.11ag/b/j/p/n/ac/ax/be.

 

Results include:

  • Overall RMS EVM

  • EVM per symbol and subcarrier

  • Spectral mask results

  • Carrier frequency offset

  • Equalized symbols constellation​

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1xEV-DO reverse link

The 1xEV-DO Reverse Link Analysis Library allows the user to analyze 1xEV-DO reverse link signals, as defined in the following standards documents:

  • 3GPP2 C.S0024-B 1xEV-DO High Rate Packet Data Air Interface

  • 3GPP2 C.S0033-B Recommended Minimum Performance Standards for CDMA2000 High Rate Packet

  • Data Access Terminal

  • TIA/EIA/IS-856 1xEV-DO High Rate Packet Data Air Interface Specification

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Results include:

  • Error Vector Magnitude (EVM), (RMS and Peak)

  • Rho

  • Spectral Mask Results

  • Average Power

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GSM

A complete suite of measurement functions to characterize GSM and EDGE mobile transceiver RF performance using procedures as defined in 3GPP 51-010-1 sections 13.17.1-4 and 13.14.2.

 

Results include:

  • TX average power and burst power profile

  • Phase error (peak and RMS)

  • 8PSK EVM, origin offset suppression

  • 95th percentile EVM

  • Frequency error

  • Output radio frequency spectrum

  • Receiver BER measurement

  • Fast Sequence Tuning (FST)

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TD-SCDMA

The TD-SCDMA Analysis Library provides analysis of Time Division-Synchronous Code Division Multiple Access (TD-SCDMA) signals that adhere to the technical specifications 3GPP TS 25.223 and 34.122.


Results include:

  • Error Vector Magnitude (EVM), (RMS and Peak)

  • Adjacent Channel Leakage Ratio (ACLR)

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CDMA2000R

The CDMA2000 Reverse Link Analysis Library contains methods and properties that can be used to analyze CDMA2000 Reverse Link signals.

 

Results include:

  • Average Power

  • Burst Results (Length, Peak Power, Position, Fall Time, Rise Time)

  • Carrier Leak (carrier feed through)

  • Code Domain Power (CDP)

  • Channel Power

  • Error Vector Magnitude (EVM)

  • Frequency Error

  • Magnitude Error

  • Number of ACPR Offset

  • Phase Error

  • QPSK Origin Offset

  • Rho

  • Spectrum Mask Results (Fail Result, Number of Failures)

  • Transmit Time Error

  • Trace Data (Length, Results)

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UMTS

The UMTS Uplink Analysis Library provides analysis of UMTS Uplink signals that adhere to the following specifications:

  • 3GPP TS 25.211 Physical channels and mapping of transport channels onto physical channels (FDD) (Release 8)

  • 3GPP TS 25.213 Spreading and modulation (FDD) (Release 8)

  • 3GPP TS 34.121 Radio transmission and reception (FDD); Part 1: Conformance Specification

 

Results include:

  • Composite Error Vector Magnitude (EVM)

  • Adjacent Channel Leakage Ratio (ACLR)

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LTE-FDD/TDD

The LTE Uplink Analysis Library provides analysis of Long Term Evolution (LTE) FDD Uplink signals that adhere to the 3GPP 36.211 technical specification. All measurements adhere to the 3GPP TS 36.521-1 test specification.

 

Results include:

  • Error Vector Magnitude (EVM), RMS

  • Adjacent Channel Leakage Ratio (ACLR)

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How it works
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sales@merlintest.com

Tel: 512-705-4674

627 Hwy 71 STE B

Bastrop, TX 78602

© 2022 by Merlin Test Technologies

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